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Bruker Nano Surfaces

AFM nanoelectrical Training 

October 14-15, 2020 in Karlsruhe, Germany

During this 2-day course you can improve your skillset and understanding of common electrical modes used on Bruker AFMs. This training will focus on using the Icon AFM for practical work, but the principals and software operation are the same as for electrical measurements using Brukers Multimode AFM.

The course covers; software usage, probe selection, and sample preparation for electrical measurements, TUNA mode operation for measuring currents in the fA to µA range with the AFM tip during scanning (TUNA mode can also be combined with Brukers PeakForce or Dcube options), Kelvin probe force microscopy (KPFM) and the various version of this mode for measuring work function (KPFM can be combined with PeakForce), Scanning Capacitance Microscopy (SCM) for distinguishing doping type and concentration in semiconductor devices (can be combined with Dcube option). The course will be held in Karlsruhe, Germany. The language will be English.

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