Bruker Nano Surfaces
AFM Icon Training
October 6-8, 2020 in Palaiseau, France
During this modular 3-day course you can improve your skillset on the Bruker Dimension Icon system. If you are new to the system or need a refresher, you can choose to stay the full three days or participate only in one or two days, depending on your personal requirements.
The course covers basic software usage, probe selection, probe installation, laser alignment, standard experiments in contact, tapping and ScanAsyst mode on the first day. A brief look into the analysis functions is also scheduled for day one. On the second day advanced options of the Dimension Icon AFM are covered. We will cover calibrating the AFM, optimizing scan conditions to minimize sample and tip degradation, training on lift mode and work in liquids. Day three will be used for introduction to force measurements as PFQNM. The course will be held in Palaiseau, France and the primary language will be French.